By Nobuo Tanaka
In this booklet, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are defined within the form of a textbook. The booklet specializes in the reason of electron microscopic imaging of TEM and STEM with no together with in most cases textual content distracting details on easy wisdom of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, that are defined individually within the appendices. A accomplished rationalization is equipped at the foundation of Fourier rework thought, and this procedure is exclusive compared to different complicated assets on high-resolution electron microscopy. With the current textbook, readers are ended in comprehend the essence of the imaging theories of TEM and STEM with out being diverted by way of different wisdom of electron microscopy. The updated details during this ebook, really on imaging info of STEM and aberration corrections, is efficacious world wide for today’s graduate scholars and execs simply beginning their careers.
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Additional info for Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM
Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM by Nobuo Tanaka